title
Testide genereerimine juhuslike arvude meetodil digitaalskeemide rikete diagnoosiks
Random Diagnostic Test Generation for Digital Circuits
author
Osimiry, Emmanuel Ovie
keywords
digital circuits and systems
test generation
master's theses
supervisor
Ubar, Raimund-Johannes
defence date
08.09.2016
language
eng
institution
Tallinna Tehnikaülikool
Tallinn University of Technology
faculty
Infotehnoloogia teaduskond
Faculty of Information Technology
department / college
Arvutitehnika instituut
Department of Computer Engineering
subunit
Arvutisüsteemide diagnostika ja verifitseerimise õppetool
Chair of Computer Systems Test and Verification