title
Characterization of Interfaces Between the Metal Film and Silicon Carbide Semiconductor
Metallkontakti ja ränikarbiidi vahelise liidespinna karakteriseerimine
author
Ziko, Mehadi Hasan
keywords
P-type SiC
IV
CV
DLTS
L-DLTS
electron-irradiation
DW
sputtering
description
Paper II not available electronically
Artikkel II ei ole elektrooniliselt kättesaadav
serial number
52/2021
publisher
TalTech Press
TalTech Kirjastus
defence date
29.11.2021
identifier
https://digikogu.taltech.ee/et/Item/34be534c-63e8-4013-b271-eaf1a7cb22e7
ISBN 978-9949-83-764-9 (PDF)
https://doi.org/10.23658/taltech.52/2021
language
rights
CC BY-NC-SA