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Kärber, Erki - supervisor
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items found: 2
1.
Pooljuhtkilede paksuse mõõtmine ja kaardistamine spektroskoopilise reflektomeetria abil. Semiconductor films thickness measurement and mapping using spectroscopic reflectometer
Kukk, Mart
12.06.2015
master's theses
2.
Keemilise pihustuspürolüüsi meetodil valmistatud NiO õhukeste kilede struktuursed, optilised ja elektrilised omadused. Structural, optical and electrical properties of NiO thin films prepared by chemical spray pyrolysis
Unt, Tarmo
12.06.2015
master's theses
items found: 2
1