- TalTech raamatukogu digikogu

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Characteristics of the Manager's Personality and Their Effect on Organization Management on the Example of Arvato Services Estonia OÜ (1)
Characterization and modelling of erosion wear of powder composite materials and coatings (1)
Characterization and possible use of industrial limestone in central Estonia (1)
Characterization of a novel isoform of the transcription factor MED24 in cancer cells (2)
Characterization of Bacterial Dye-Decolorizing Peroxidases (1)
Characterization of blackcurrant and sea buckthorn pomace fermentation under different conditions (1)
Characterization of Cu2ZnSnS4 Monograin Powders Grown in Molten LiI, NaI, KI, RbI and CsI (1)
Characterization of Estonian woods using analytical methods combined with multivariate statistical techniques (1)
Characterization of gas-phase photocatalytic activity of spray pyrolysis-synthesized TiO2 thin films coatings by oxidation of acetone and heptane (1)
Characterization of GFP-tagged Daughterless in the fruit fly central nervous system (1)
Characterization of growth dynamics and enzymatic activity of novel Ligilactobacillus salivarius strains (1)
Characterization of Human IVF Embryo Growth Medium Proteome (1)
Characterization of Industrial Phenolic Waters by Chromatographic Methods (1)
Characterization of Interfaces Between the Metal Film and Silicon Carbide Semiconductor (1)
Characterization of L. lactis DGCC2631 stress response on a proteome level using chemostat cultivation (1)
Characterization of leukocyte population in blood of human melanoma patients (1)
Characterization of nickel(II)oxide films deposited via pulsed laser deposition (1)
Characterization of peptide assimilation by wine yeasts. (1)
Characterization of physico-chemical properties of copper and silver nanoparticles and their antibacterial impact on Escherichia coli (1)
Characterization of powdered pea aroma profiles using SPME-GC/MS-O and sensory analysis (1)
Characterization of protein composition in human in vitro fertilization mmbryo growth medium (1)
Characterization of Radiation Damage by Transmission Electron Microscopy (1)
Characterization of semiconductor devices by means of numerical simulations (1)
Characterization of SiC Power Schottky Barrier Diode and Merged PiN Schottky Diode in Spice Model (1)
Characterization of Silicon Carbide (SiC) and Graphene-Based Novel Semiconductor Devices (1)

Kirjeid leitud: 50156