title
Testide genereerimine viivitusriketele digitaalskeemides
Transition Delay Test Generation Using Stuck-At-Fault Test Patterns
author
Ali, Md Younus
keywords
magistritööd
master's theses
supervisor
Ubar, Raimund-Johannes
defence date
29.05.2020
language
eng
institution
Tallinna Tehnikaülikool
Tallinn University of Technology
faculty
Infotehnoloogia teaduskond
School of Information Technologies
department / college
Arvutisüsteemide instituut
Department of Computer Systems