title
Characterization of Interfaces Between the Metal Film and Silicon Carbide Semiconductor
Metallkontakti ja ränikarbiidi vahelise liidespinna karakteriseerimine
author
Ziko, Mehadi Hasan
keywords
P-type SiC
IV
CV
DLTS
L-DLTS
electron-irradiation
DW
sputtering
evaporation
dissertations
description
Paper II not available electronically
Artikkel II ei ole elektrooniliselt kättesaadav
serial number
52/2021
publisher
TalTech Press
TalTech Kirjastus
supervisor
Koel, Ants
Pardy, Tamas
defence date
29.11.2021
identifier
https://digikogu.taltech.ee/et/Item/34be534c-63e8-4013-b271-eaf1a7cb22e7
ISBN 978-9949-83-764-9 (PDF)
https://doi.org/10.23658/taltech.52/2021
language
eng
rights
CC BY-NC-SA
institution
Tallinn University of Technology
Tallinna Tehnikaülikool
faculty
School of Information Technologies
Infotehnoloogia teaduskond
department / college
Thomas Johann Seebeck Department of Electronics
Thomas Johann Seebecki elektroonikainstituut