title
Constraints Solving Based Hierarchical Test Generation for Synchronous Sequential Circuits
Kitsenduste lahendamisel baseeruv hierarhiline testigenereerimine sünkroonsetele järjestikskeemidele
series
Informatics and System Engineering C
Informaatika ja süsteemitehnika C
author
Viilukas, Taavi
keywords
automaatsed testide genereerijad
hierarhiline ATPG
digitaalsüsteemide test
dissertatsioonid
automated test pattern generation
hierarchical ATPG
digital testing
dissertations
publisher
TUT Press
supervisor
Raik, Jaan
defence date
30.11.2012
identifier
ISBN 9789949233830 (publication)
ISBN 9789949233847 (pdf)
ISSN 14064731
language
eng
institution
Tallinna Tehnikaülikool
Tallinn University of Technology
faculty
Infotehnoloogia teaduskond
Faculty of Information Technology
department / college
Arvutitehnika instituut
Department of Computer Engineering